Ukubuka konke
Kungumhloli ophelele we-Pack osetshenzisiwe ekuhlolweni kwezici eziyisisekelo zepakethe yebhethri ye-Li-ion kanye ne-IC yokuvikela (esekela i-I2C, SMBus, izivumelwano zokuxhumana ze-HDQ).
Basic Fisikhunta Test
• Amandla kagesi avulekile
• Layisha amandla kagesi
• Dynamic umthwalo test
• Ukuhlolwa kwe-ACIR;
• Ukuhlolwa kwe-ThR
• Ukuhlolwa kwe-IDR
• Ukuhlolwa kwamandla kagesi okujwayelekile
• Ukuhlola okwejwayelekile kwamandla kagesi
• Ukuhlolwa kwamandla
• Ukuhlolwa kokuvuza
• IDR / THR nokulawulwa kokuhlolwa kwamandla kuvuliwe
Ukuhlolwa Kwesici Sokuvikela
• Ngokuhlolwa kokuvikelwa kwamanje: ukushaja umsebenzi wokuvikela wamanje, isikhathi sokubambezeleka sokuvikelwa nokuhlolwa komsebenzi wokutakula
Amaphuzu avelele:
Imininingwane:
Inkomba |
Imininingwane |
Ukunemba |
Amandla wesifunda avulekile |
0.1 ~ 10V |
± (0.01% RD + 0.05% FS) |
Ukuhlolwa kwe-ACIR |
0 ~ 1250 mΩ |
± (0.15% RD + 1 mΩ) |
Ukuhlolwa kwe-ThR |
200 ~ 1M |
± (0.1% RD + 100Ω) |
1M ~ 3M |
± (0.1% RD + 500Ω) |
|
Ukuhlolwa kwe-IDR |
200 ~ 1M |
± (0.1% RD + 100Ω) |
1M ~ 3M |
± (0.1% RD + 500Ω) |
|
Ukuhlolwa kwamanje kokushaja okujwayelekile (Ukushaja ukuvikelwa okwedlulele nokuvikelwa kokuvikela) |
0.1 ~ 2A |
± (0.01% RD + 0.05% FS) |
2 ~ 30A |
± (0.01% RD + 0.02% FS) |
|
Ukuhlola okwejwayelekile okujwayelekile (ukukhipha ukuvikela okwedlulele nokubambezeleka kokuvikelwa) |
0.1 ~ 2A |
± (0.01% RD + 0.5mA) |
2 ~ 30A |
± (0.02% RD + 0.5mA) |
|
Ukuhlolwa kwamandla |
0.1 ~ 10 uF |
± (5% RD + 0.05uF) |
Ukuhlolwa kokuvikelwa kwesikhashana (kufinyelelwe ngokubambezeleka kokuvikelwa) |
2 ~ 30A |
± (0.02% RD + 0.5mA) |